Author:
Weber W.,Werner C.,Schwerin A.V.
Cited by
5 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. An analytical study of substrate current in submicron MOS devices;The European Physical Journal B;2004-11
2. RF power amplifiers;Circuit Design For RF Transceivers;2003
3. Stress induced leakage current under pulsed voltage stress;Solid-State Electronics;2002-03
4. Hot-Carrier Degradation During Dynamic Stress;Hot Carrier Design Considerations for MOS Devices and Circuits;1992
5. Hot-Carrier Effects;VLSI Electronics Microstructure Science;1989