At-speed scan test with low switching activity-Reference-Cited by-同舟云学术

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At-speed scan test with low switching activity

Published:2010-04 Issue: Volume: Page:
ISSN:
Container-title:2010 28th VLSI Test Symposium (VTS)
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Author:

Moghaddam Elham K.,Rajski Janusz,Kassab Mark,Reddy Sudhakar M.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/5464131/5469528/05469580.pdf?arnumber=5469580

Cited by 53 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Test Compaction Using (k, 1)-Cycle Tests;2024 IEEE 42nd VLSI Test Symposium (VTS);2024-04-22

2. Compaction of Functional Broadside Tests for Path Delay Faults Using Clusters of Propagation Lines;2023 IEEE International Test Conference (ITC);2023-10-07

3. Cluster-based test vector re-ordering for reduced power dissipation in digital circuits;Automatika;2023-08-29

4. Functionally Possible Scan-Based Test Set as a Dual of a Compressed Multicycle Test Set;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023-04

5. Functional Test Sequences as a Source for Partially Functional Launch-on-Shift Tests;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2022-11

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