Author:
Zeng Jing,Guo Ruifeng,Cheng Wu-Tung,Mateja Michael A.,Wang Jing
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software,Electrical and Electronic Engineering,Hardware and Architecture,Software
Cited by
5 articles.
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1. SoC Speed Binning Using Machine Learning and On-Chip Slack Sensors;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2017-05
2. Adaptive Board-Level Functional Fault Diagnosis Using Incremental Decision Trees;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2016-02
3. Speed Binning Using Machine Learning And On-chip Slack Sensors;Proceedings of the 25th edition on Great Lakes Symposium on VLSI;2015-05-20
4. A new circuit for at-speed scan SoC testing;Journal of Semiconductors;2013-12
5. An On-Chip Clock Controller for Testing Fault in System on Chip;Applied Mechanics and Materials;2013-08