Determination of the Complex Refractive Index Profile of the Thin Gradient Layer by Surface Plasmon Resonance-Reference-Cited by-同舟云学术

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Determination of the Complex Refractive Index Profile of the Thin Gradient Layer by Surface Plasmon Resonance

Published:2022-10-03 Issue: Volume: Page:
ISSN:
Container-title:2022 International Conference on Information, Control, and Communication Technologies (ICCT)
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Author:

Anisimov Aleksandr V.¹,Khasanov Ildus Sh.¹

Affiliation:

1. Scientific and Technological Centre of Unique Instrumentation of the Russian Academy of Sciences,Moscow,Russia

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9976491/9976498/09976858.pdf?arnumber=9976858

Reference9 articles.

1. Nanoplazmonika;klimov,2010

2. In-plane interferometry of terahertz surface plasmon polaritons

3. Algorithm for optical characterization of dielectric gradient index nanofilm by surface plasmon resonance spectroscopy

4. Multilayer optical calculations;byrnes;arXiv 1603 02720 [physics],2020

5. Escaping local minima with local derivative-free methods: a numerical investigation

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1. Polynomial Profile Reconstruction of Gradient-Index thin Films by Surface Plasmon Microscopy Based on Acousto-Optical Tunable Filter;2023 Wave Electronics and its Application in Information and Telecommunication Systems (WECONF);2023-05-29

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