Domain Transfer for Surface Defect Detection using Few-Shot Learning on Scarce Data
Author:
Affiliation:
1. Aalen University of Applied Sciences,Aalen,Germany
2. aku.automation GmbH,Aalen,Germany
3. PlanB. GmbH,Huettlingen,Germany
4. Osnabrück University & DFKI,Semantic Information Systems Group,Osnabrück,Germany
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10217218/10217836/10217859.pdf?arnumber=10217859
Reference30 articles.
1. Transferability in deep learning: A survey;jiang;arXiv preprint arXiv 2201 05867,2022
2. A broader study of cross-domain few-shot learning;guo;Computer Vision - ECCV 2020,2020
3. Cross-Domain Few-Shot Learning Approach for Lithium-Ion Battery Surface Defects Classification Using an Improved Siamese Network
4. Experiments in cross-domain few-shot learning for image classification
5. Knowledge-aware Zero-Shot Learning: Survey and Perspective
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