Special Session: Machine Learning for Semiconductor Test and Reliability-Reference-Cited by-同舟云学术

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Special Session: Machine Learning for Semiconductor Test and Reliability

Published:2021-04-25 Issue: Volume: Page:
ISSN:
Container-title:2021 IEEE 39th VLSI Test Symposium (VTS)
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Author:

Amrouch Hussam,Chowdhury Animesh Basak,Jin Wentian,Karri Ramesh,Khorrami Farshad,Krishnamurthy Prashanth,Polian Ilia,van Santen Victor M.,Tan Benjamin,Tan Sheldon X.-D.

Funder

Office of Naval Research

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9440994/9440995/09441052.pdf?arnumber=9441052

Cited by 9 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Identifying Good-Dice-in-Bad-Neighborhoods Using Artificial Neural Networks;IEEE Transactions on Semiconductor Manufacturing;2024-08

2. RTL Simulation Acceleration with Machine Learning Models;2024 25th International Symposium on Quality Electronic Design (ISQED);2024-04-03

3. Reliability forecasting and Accelerated Lifetime Testing in advanced CMOS technologies;Microelectronics Reliability;2023-12

4. AI/ML algorithms and applications in VLSI design and technology;Integration;2023-11

5. CNN-Based Stochastic Regression for IDDQ Outlier Identification;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023-11

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