36.3 A Modeling Attack Resilient Strong PUF with Feedback-SPN Structure Having <0.73% Bit Error Rate Through In-Cell Hot-Carrier Injection Burn-In
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Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9365732/9365735/09365942.pdf?arnumber=9365942
Cited by 14 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
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2. SpongePUF: A Modeling Attack Resilient Strong PUF with Scalable Challenge Response Pair;2024 IEEE International Symposium on Hardware Oriented Security and Trust (HOST);2024-05-06
3. A New Reconfigurable True Random Number Generator and Physical Unclonable Function Unified Chip With On-Chip Auto-Calibration;IEEE Transactions on Circuits and Systems I: Regular Papers;2023-12
4. A 3.02 pJ/Bit 3T-APS-Based In-Sensor Strong PUF Featuring Near-100% Hardware Reuse Ratio and High Resilience to Machine Learning Attacks;IEEE Transactions on Circuits and Systems II: Express Briefs;2023-11
5. A 690fJ/Bit ML-Attack-Resilient Strong PUF Based on Subthreshold Voltage Attenuator Ring with Closed-Loop Feedback;ESSCIRC 2023- IEEE 49th European Solid State Circuits Conference (ESSCIRC);2023-09-11
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