Fruit Defect Inspection System Using Image Processing and IoT Framework-Reference-Cited by-同舟云学术

Fruit Defect Inspection System Using Image Processing and IoT Framework

Published:2023-03-01 Issue: Volume: Page:
ISSN:
Container-title:2023 International Conference on Emerging Smart Computing and Informatics (ESCI)
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Author:

Chaudhari Bhushan¹,Patil Durwa¹,Patil Hemant¹,Patil Rupal¹,Gawali Jui¹

Affiliation:

1. SVKM's Institute Of Technology,Department of Information Technology,Dhule,India

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10099470/10099482/10099913.pdf?arnumber=10099913

Reference25 articles.

1. Fruit defect detection from color images using ACM and MFCM algorithms

2. Guava defect detection using hyperspectral imaging with fluorescent light source

3. A survey of transfer learning for convolutional neural networks;ricardo;25th SIBGRAPI Conference on Graphics Patterns and Images Tutorials (SIBGRAPI-T),2019

4. Implementation of Deep Learning Methods to Identify Rotten Fruits;chakraborty;IEEE Proceedings of the Fifth International Conference on Trends in Electronics and Informatics (ICOEI),2016

5. Fruit Defect Detection Based on Speeded Up Robust Feature Technique;ashwani;5th International Conference on Reliability Infocom Technologies and Optimization (ICRITO) (Trends and Future Directions),2016

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