Author:
Ray S.K.,John S.,Oswal S.,Banerjee S.K.
Cited by
24 articles.
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1. Characterization of traps in SiGe:C channel heterojunction PMOSFETs;16th International Workshop on Physics of Semiconductor Devices;2012-10-15
2. A Brief History of the Field;Circuits and Applications Using Silicon Heterostructure Devices;2007-12-13
3. A Brief History of the Field;Measurement and Modeling of Silicon Heterostructure Devices;2007-12-13
4. A Brief History of the Field;Silicon Heterostructure Devices;2007-12-13
5. A Brief History of the Field;Fabrication of SiGe HBT BiCMOS Technology;2007-12-13