Author:
Biggeri U.,Borchi E.,Bruzzi M.,Li Z.,Lazanu S.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics
Cited by
23 articles.
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1. Recent progress of CERN RD50 Collaboration;Transactions of Nonferrous Metals Society of China;2006-06
2. Microscopic modelling of defects production and their annealing after irradiation in silicon for HEP particle detectors;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2003-11
3. The influence of initial impurities and irradiation conditions on defect production and annealing in silicon for particle detectors;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2003-03
4. Radiation Defects in Silicon due to Hadrons and Leptons, their Annealing and Influence on Detector Performance;Physica Scripta;2002-01-01
5. Thermally stimulated current method applied to highly irradiated silicon diodes;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2002-01