Parametric counterfeit IC detection via Support Vector Machines-Reference-Cited by-同舟云学术

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Parametric counterfeit IC detection via Support Vector Machines

Published:2012-10 Issue: Volume: Page:
ISSN:
Container-title:2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
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Author:

Huang Ke,Carulli John M,Makris Yiorgos

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/6362314/6378188/06378191.pdf?arnumber=6378191

Cited by 58 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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2. A review on machine learning based counterfeit integrated circuit detection;Engineering Research Express;2023-10-13

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5. Detection of Counterfeit Accelerometer ICs Using Clustering and Unsupervised Machine Learning of Allan Variance;2023 IEEE 66th International Midwest Symposium on Circuits and Systems (MWSCAS);2023-08-06

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