Trouble-Shooting at GAN Point: Improving Functional Safety in Deep Learning Accelerators-Reference-Cited by-同舟云学术

Trouble-Shooting at GAN Point: Improving Functional Safety in Deep Learning Accelerators

Author:

Kundu Shamik¹^ORCID,Banerjee Suvadeep²^ORCID,Raha Arnab²^ORCID,Su Fei³^ORCID,Natarajan Suriyaprakash²,Basu Kanad¹^ORCID

Affiliation:

1. Department of Electrical and Computer Engineering, University of Texas at Dallas, Richardson, TX, USA

2. Intel Corporation, Santa Clara, CA, USA

3. Intel Corporation, Folsom, CA, USA

Funder

Semiconductor Research Corporation

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Computational Theory and Mathematics,Hardware and Architecture,Theoretical Computer Science,Software

Link

Reference37 articles.

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