Reaping Both Latency and Reliability Benefits With Elaborate Sanitization Design for 3D TLC NAND Flash-Reference-Cited by-同舟云学术

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Reaping Both Latency and Reliability Benefits With Elaborate Sanitization Design for 3D TLC NAND Flash

Published:2023-11 Issue:11 Volume:72 Page:3029-3041
ISSN:0018-9340
Container-title:IEEE Transactions on Computers
language:
Short-container-title:IEEE Trans. Comput.

Author:

Wang Wei-Chen¹^ORCID,Ho Chien-Chung²^ORCID,Li Yung-Chun³^ORCID,Chen Liang-Chi²^ORCID,Chang Yu-Ming⁴^ORCID

Affiliation:

1. Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, USA

2. Department of Computer Science and Information Engineering, National Cheng Kung University, Tainan, Taiwan

3. Macronix Emerging System Lab., Macronix International Co., Ltd., Hsinchu, Taiwan

4. Wolley Inc., Hsinchu, Taiwan

Funder

National Science and Technology Council

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Computational Theory and Mathematics,Hardware and Architecture,Theoretical Computer Science,Software

Link

http://xplorestaging.ieee.org/ielx7/12/10274758/10113786.pdf?arnumber=10113786

Reference45 articles.

1. User-level secure deletion on log-structured file systems

2. On enduring more data through enabling page rewrite capability on multi-level-cell flash memory

3. Ghosts of deletions past: New secure deletion challenges and solutions;diesburg,2016

4. Open Block Characterization and Read Voltage Calibration of 3D QLC NAND Flash

5. NASA: NVM-Assisted Secure Deletion for Flash Memory

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