Author:
Park Sung-Kun,Lee Tae-Ho,Kwon Young-Jun,Park Chang-Su,Cho In-Wook,Hong Sung-Joo,Oh Hoon-Sang,Yoo Kyung-Dong,Joo Young-Dong,Lee Jun-Ho,Kim Seung-Deok
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials
Cited by
1 articles.
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1. Research on Vt Window Improvement Process of 2T Sonos Embedded Flash;2023 China Semiconductor Technology International Conference (CSTIC);2023-06-26