1. Assessment of BTI‐induced deterioration in vacuum based undoped structure;International Journal of Numerical Modelling: Electronic Networks, Devices and Fields;2024-03
2. Effects of NBTI On PMOS Device With Technology Scaling;2022 IEEE 13th Annual Ubiquitous Computing, Electronics & Mobile Communication Conference (UEMCON);2022-10-26
3. Reliability analysis of P-type SOI FinFETs with multiple SiGe channels on the degradation of NBTI;2020 IEEE Silicon Nanoelectronics Workshop (SNW);2020-06
4. Two‐stage degradation in n‐channel LTPS‐TFTs under negative and positive bias stresses;Journal of the Society for Information Display;2020-01-26
5. Threshold Voltage Degradation for n-Channel 4H-SiC Power MOSFETs;Journal of Low Power Electronics and Applications;2020-01-08