Erratic fluctuations of sram cache vmin at the 90nm process technology node-Reference-Cited by-同舟云学术

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Erratic fluctuations of sram cache vmin at the 90nm process technology node

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Container-title:IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest.
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Author:

Agostinelli M.,Hicks J.,Xu J.,Woolery B.,Mistry K.,Zhang K.,Jacobs S.,Jopling J.,Yang W.,Lee B.,Raz T.,Mehalel M.,Kolar P.,Wang Y.,Sandford J.,Pivin D.,Peterson C.,DiBattista M.,Pae S.,Jones M.,Johnson S.,Subramanian G.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/10701/33791/01609436.pdf?arnumber=1609436

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