Author:
Nicollian P.E.,Krishnan A.T.,Bowen C.,Chakravarthi S.,Chancellor C.A.,Khamankar R.B.
Cited by
1 articles.
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1. Tunneling Leakage Current Dependent RDD Model Framework for Gate Oxide TDDB;2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD);2023-09-27