Insulator Defect Detection and Recognition Utilizing Stochastic Configuration Network and Convolutional Neural Network-Reference-Cited by-同舟云学术

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Insulator Defect Detection and Recognition Utilizing Stochastic Configuration Network and Convolutional Neural Network

Published:2023-08-21 Issue: Volume: Page:
ISSN:
Container-title:2023 5th International Conference on Industrial Artificial Intelligence (IAI)
language:
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Author:

Liu Siyuan¹,Pang Xinfu¹,Liu Wei¹,Li Haibo¹,Ma Yihua¹

Affiliation:

1. Shenyang Institute of Engineering,Key Laboratory of Energy Saving and Controlling in Power System of Liaoning Province,Shenyang,China

Funder

National Natural Science Foundation of China

China Scholarship Council

Natural Science Foundation of Liaoning Province

Department of Education of Liaoning Province

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10326186/10327501/10327533.pdf?arnumber=10327533

Reference15 articles.

1. Alias-Free Generative Adversarial Networks;karras;Advances in neural information processing systems,2021

2. Stochastic Configuration Networks: Fundamentals and Algorithms

3. Deep Residual Learning for Image Recognition;he;2016 IEEE Conference on Computer Vision and Pattern Recognition (CVPR),2016

4. A Cloud Edge Collaborative Intelligence Method of Insulator String Defect Detection for Power IIoT

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