Yield Prediction With a New Generalized Process Capability Index Applicable to Non-Normal Data-Reference-Cited by-同舟云学术

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Yield Prediction With a New Generalized Process Capability Index Applicable to Non-Normal Data

Published:2016-06 Issue:6 Volume:35 Page:931-942
ISSN:0278-0070
Container-title:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
language:
Short-container-title:IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.

Author:

Weber Stephan,Ressurreicao Tiago,Duarte Candido^ORCID

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software

Link

http://xplorestaging.ieee.org/ielx7/43/7471560/07275156.pdf?arnumber=7275156

Cited by 22 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Classical Inference of a New PCI CNpmkc for Logistic-Exponential Process Distribution;International Journal of Reliability, Quality and Safety Engineering;2024-05-20

2. Bootstrap confidence intervals of process capability indices Spmk, Spmkc and Cs for Frechet distribution;Quality and Reliability Engineering International;2023-04-07

3. Estimation and Confidence Intervals of a New PCI $C_{N p m c}$ for Logistic-Exponential Process Distribution;Journal of Mathematics;2022-09-23

4. Assessment of Two Process Capabilities by Using Generalized Confidence Intervals and its Applications;Annals of Data Science;2022-09-23

5. Modified estimation and confidence intervals of an asymmetric loss‐based process capability index Cpm′$\mathcal {C}^{\prime }_{pm}$;Quality and Reliability Engineering International;2022-08-16

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