Author:
Jallepalli Srinivas,Mooraka Ram,Parihar Sanjay,Hunter Earl,Maalouf Elie
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software
Cited by
4 articles.
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2. Improvements to Statistical Characterization and Modeling, and a Caution to be Aware of Spurious Correlation in Statistical Simulation;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2022
3. An Enhanced Machine Learning Model for Adaptive Monte Carlo Yield Analysis;Proceedings of the 2020 ACM/IEEE Workshop on Machine Learning for CAD;2020-11-16
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