Author:
Mammo Biruk W.,Bertacco Valeria,DeOrio Andrew,Wagner Ilya
Funder
National Science Foundation
C-FAR, one of the six SRC STARnet Centers, sponsored by MARCO and DARPA
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software
Cited by
9 articles.
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1. EveCheck: An Event-Driven, Scalable Algorithm for Coherent Shared Memory Verification;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023-02
2. An affordable post-silicon testing framework applied to a RISC-V based microcontroller;2021 IEEE Latin America Electron Devices Conference (LAEDC);2021-04-19
3. A Low Overhead Methodology for Validating Memory Consistency Models in Chip Multiprocessors;2020 33rd International Conference on VLSI Design and 2020 19th International Conference on Embedded Systems (VLSID);2020-01
4. RCTS: Random Cyclic Testing System;Communications in Computer and Information Science;2019
5. Test Generation and Lightweight Checking for Multi-core Memory Consistency;Post-Silicon Validation and Debug;2018-09-02