Characterization of Systematic Bias in ALOS-2 Multilooked Interferograms-Reference-Cited by-同舟云学术

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Characterization of Systematic Bias in ALOS-2 Multilooked Interferograms

Published:2024-07-07 Issue: Volume:60 Page:10703-10706
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Container-title:IGARSS 2024 - 2024 IEEE International Geoscience and Remote Sensing Symposium
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Author:

Sugimoto Ryu¹,Morishita Yu¹,Shimada Masanobu²,Natsuaki Ryo³,Tsutsumi Chiaki¹,Nakamura Ryosuke¹,Kouyama Toru¹

Affiliation:

1. National Institute of Advanced Industrial Science and Technology,Digital Architecture Research Center,Japan

2. Tokyo Denki University,Division of Architectural, Civil and Environmental Engineering, School of Science and Engineering,Japan

3. The University of Tokyo,Department of Electrical Engineering and Information Systems,Japan

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx8/10640349/10640352/10642365.pdf?arnumber=10642365

Reference11 articles.

1. Study of Systematic Bias in Measuring Surface Deformation With SAR Interferometry

2. On Closure Phase and Systematic Bias in Multilooked SAR Interferometry

3. Characterizing and correcting phase biases in short-term, multilooked interferograms

4. Phase Inconsistencies and Multiple Scattering in SAR Interferometry

5. Comments on;De Luca;IEEE Trans. Geosci. Remote Sens,2022

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