Author:
Sala F.,Gabrys R.,Dolecek L.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering
Cited by
45 articles.
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1. Achieving Near-Zero Read Retry for 3D NAND Flash Memory;Proceedings of the 29th ACM International Conference on Architectural Support for Programming Languages and Operating Systems, Volume 2;2024-04-27
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3. Features for Read Reference Voltage Estimation in NAND Flash Memory;2023 IEEE 13th International Conference on Consumer Electronics - Berlin (ICCE-Berlin);2023-09-03
4. Retention Leveling: Leverage Retention Refreshing and Wear Leveling Techniques to Enhance Flash Reliability with the Awareness of Temperature;2023 IEEE 12th Non-Volatile Memory Systems and Applications Symposium (NVMSA);2023-08
5. Improved Constructions of Permutation and Multi-Permutation Codes Correcting a Burst of Stable Deletions;IEEE Transactions on Information Theory;2023-07