ATOM: Automated Black-Box Testing of Multi-Label Image Classification Systems-Reference-Cited by-同舟云学术

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ATOM: Automated Black-Box Testing of Multi-Label Image Classification Systems

Published:2023-09-11 Issue: Volume: Page:
ISSN:
Container-title:2023 38th IEEE/ACM International Conference on Automated Software Engineering (ASE)
language:
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Author:

Hu Shengyou¹,Wu Huayao¹,Wang Peng¹,Chang Jing²,Tu Yongjun²,Jiang Xiu²,Niu Xintao¹,Nie Changhai¹

Affiliation:

1. Nanjing University,State Key Laboratory for Novel Software Technology,Department of Computer Science and Technology,China

2. Guangdong OPPO Mobile Telecommunications Corp., Ltd.,China

Funder

National Natural Science Foundation of China

Natural Science Foundation of Jiangsu Province

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10298258/10298286/10298557.pdf?arnumber=10298557

Reference76 articles.

1. DeepGauge: multi-granularity testing criteria for deep learning systems

2. DeepXplore

3. Structural Test Coverage Criteria for Deep Neural Networks

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