NBTI in Nanoscale MOSFETs—The Ultimate Modeling Benchmark-Reference-Cited by-同舟云学术

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NBTI in Nanoscale MOSFETs—The Ultimate Modeling Benchmark

Published:2014-11 Issue:11 Volume:61 Page:3586-3593
ISSN:0018-9383
Container-title:IEEE Transactions on Electron Devices
language:
Short-container-title:IEEE Trans. Electron Devices

Author:

Grasser Tibor,Rott Karina,Reisinger Hans,Waltl Michael,Schanovsky Franz,Kaczer Ben

Funder

Austrian Science Fund

European Community¿s FP7 Programme through the MORDRED Project

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx7/16/6930833/06902764.pdf?arnumber=6902764

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