Exploring the Use of Local Binary Patterns as Focus Measure
Author:
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx5/5172579/5172580/05172737.pdf?arnumber=5172737
Cited by 11 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. An Efficient Technique Based on Deep Learning for Automatic Focusing in Microscopic System;EAI/Springer Innovations in Communication and Computing;2024
2. A higher performance shape from focus strategy based on unsupervised deep learning for 3D shape reconstruction;Multimedia Tools and Applications;2023-09-28
3. Deep Learning Based Focus Measurement Operator for 3D Imaging in Microscopic Systems;2023 31st Signal Processing and Communications Applications Conference (SIU);2023-07-05
4. A New High Quality Focus Measurement Operator Based on Nonsubsampled Shearlet Transform for 3D Shape Reconstruction;Mühendislik Bilimleri ve Araştırmaları Dergisi;2023-04-30
5. Machine learning-based automatic focusing for high magnification systems;Engineering Applications of Artificial Intelligence;2023-02
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