Nanocharacterization of a novel copper-membrane and functionalized insulator-semiconductor by atomic force microscopy-Reference-Cited by-同舟云学术

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Nanocharacterization of a novel copper-membrane and functionalized insulator-semiconductor by atomic force microscopy

Published: Issue: Volume: Page:
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Container-title:Proceedings of IEEE Sensors, 2004.
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Author:

Marques de Oliveira I.A.,Pla M.,Escriche L.l.,Casabo J.,Zine N.,Bausells J.,Bessueille F.,Samitier J.,Errachid A.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/9624/30805/01426270.pdf?arnumber=1426270

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Atomic Force Microscopy and X-Ray Photoelectron Spectroscopy of Lead(II) Membrane Electrode Based on Dithiodibenzoic Acid as Ionophore;Electroanalysis;2012-01-17

2. Biogenic Synthesis of Au Nanoparticles Using Vascular Plants;Industrial & Engineering Chemistry Research;2010-11-02

3. Direct Patterning of Anti‐Human Serum Albumin Antibodies on Aldehyde‐Terminated Silicon Nitride Surfaces for HSA Protein Detection;Small;2009-06-30

4. Surface modifications of silicon nitride for cellular biosensor applications;Journal of Materials Science: Materials in Medicine;2008-01-25

5. Nanostructuring of Langmuir‐Blodgett Films Containing a Novel Thiomacrocyclic Ionophore on Si3N4/SiO2/Si for Copper Ion Recognition;Analytical Letters;2006-07

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