NSOM-based characterization method applicable to optical channel waveguide with a solid-state cladding-Reference-Cited by-同舟云学术

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NSOM-based characterization method applicable to optical channel waveguide with a solid-state cladding

Published:2005-04 Issue:4 Volume:17 Page:846-848
ISSN:1041-1135
Container-title:IEEE Photonics Technology Letters
language:
Short-container-title:IEEE Photon. Technol. Lett.

Author:

Wonsoo Ji ,Daechan Kim ,Hyun Jun Kim ,Beom-Hoan O ,Se-Geun Park ,El-Hang Lee ,Seung Gol Lee

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx5/68/30588/01411896.pdf?arnumber=1411896

Cited by 8 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Sensitivity maximized near-field scanning optical microscope with dithering sample stage;Review of Scientific Instruments;2012-09

2. Near-field measurement of amplitude and phase in silicon waveguides with liquid cladding;Optics Letters;2011-05-13

3. A new method of Q factor optimization by introducing two nodal wedges in a tuning-fork/fiber probe distance sensor;Review of Scientific Instruments;2010-09

4. Noise-robust Phase Gradient Retrieval Formulation for Phase-shifting Interferometry;Journal of the Optical Society of Korea;2010-06-25

5. Measuring near-field optical distributions emitted from chip surface of photonic crystal patterned light emitting diodes;SPIE Proceedings;2008-04-25

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