Architectural Radiation Hardening of CMOS Power Management Circuits through Bias Tuning
Author:
Affiliation:
1. Arizona State University,School of Electrical, Computer and Energy Engineering,Tempe,AZ,USA
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10139918/10139926/10140031.pdf?arnumber=10140031
Reference16 articles.
1. Investigation of TID Effects on Subthreshold Bandgap Reference Circuits Fabricated in a SOI Process
2. Single-Event Transient and Total Dose Response of Precision Voltage Reference Circuits Designed in a 90-nm SiGe BiCMOS Technology
3. Self-Adjusting Deadtime Generator for High-Efficiency High-Voltage Switched-Mode Power Amplifiers
4. A CMOS bandgap reference circuit with sub-1-V operation
5. Radiation Hardened CMOS Integrated Circuits for Time-Based Signal Processing
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