A Fault Detection Method for Analog Circuits Based on the Wavelet Features and One-class KNN-Reference-Cited by-同舟云学术

A Fault Detection Method for Analog Circuits Based on the Wavelet Features and One-class KNN

Published:2021-10-21 Issue: Volume: Page:
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Container-title:2021 International Conference on Sensing, Measurement & Data Analytics in the era of Artificial Intelligence (ICSMD)
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Author:

Zhang Fuyong,Hong Zhiwei,Gao Tianyu,Yin Shuangyan

Funder

National Natural Science Foundation of China

Publisher

IEEE

Link

Reference13 articles.

2. A deep forest based fault diagnosis scheme for Electronics-Rich analog circuit systems;jia;IEEE Transactions on Industrial Electronics,2020

3. one class KNN for signal identification: a biological case study;di gesù;International Journal of Knowledge Engineering and Soft Data Paradigms,2009

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