In Situ Surface Voltage Measurements of Dielectrics Under Electron Beam Irradiation-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

In Situ Surface Voltage Measurements of Dielectrics Under Electron Beam Irradiation

Published:2014-01 Issue:1 Volume:42 Page:255-265
ISSN:0093-3813
Container-title:IEEE Transactions on Plasma Science
language:
Short-container-title:IEEE Trans. Plasma Sci.

Author:

Hodges Joshua L.,Dennison John Robert,Dekany Justin,Wilson Gregory,Evans Amberly,Sim Alec M.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Condensed Matter Physics,Nuclear and High Energy Physics

Link

http://xplorestaging.ieee.org/ielx7/27/6704339/06683020.pdf?arnumber=6683020

Cited by 9 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Comparison of Pulsed Electroacoustic Measurements and AF-NUMIT3 Modeling of Polymers Irradiated with Monoenergetic Electrons;Journal of Spacecraft and Rockets;2023-03

2. On the Measurement of Surface Voltage of Insulators and Bushings;IEEE Transactions on Power Delivery;2022-02

3. Charging and Discharging Mechanism of Polyimide under Electron Irradiation and High Voltage;Polyimide for Electronic and Electrical Engineering Applications;2021-05-05

4. Controlling the surface potential of a dielectric target irradiated by an electron beam in medium vacuum;Vacuum;2021-05

5. Total ionizing dose effects on digital micromirror devices;Journal of Astronomical Telescopes, Instruments, and Systems;2020-12-18

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP