A Bibliography of Accelerated Test Plans Part II—References
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality
Link
http://xplorestaging.ieee.org/ielx5/24/32272/01505040.pdf?arnumber=1505040
Cited by 89 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Highly accelerated life testing (HALT): A review from a statistical perspective;WIREs Computational Statistics;2024-07
2. Statistical Estimation of Random Failure Probability over Time Based on Operating Environment;Journal of the Korean Institute of Industrial Engineers;2024-02-29
3. Inference and optimal design of accelerated life test using the geometric process for power rayleigh distribution under time-censored data;Journal of Intelligent & Fuzzy Systems;2023-12-02
4. Data analysis for accelerated life tests via Weibull‐gamma frailty regression models;Applied Stochastic Models in Business and Industry;2023-05-18
5. Experimental designs for accelerated degradation tests based on linear mixed effects models;Communications in Statistics - Theory and Methods;2022-09-14
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