Key technology for intelligent detection of colour defects in the clothing-Reference-Cited by-同舟云学术

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Key technology for intelligent detection of colour defects in the clothing

Published:2022-11-18 Issue: Volume: Page:
ISSN:
Container-title:2022 5th World Conference on Mechanical Engineering and Intelligent Manufacturing (WCMEIM)
language:
Short-container-title:

Author:

Wenkai Yang¹,Yongbin Zhang¹,Fu Xiuli²,Yuansheng Qi¹

Affiliation:

1. School of Mechatronics Engineering, Beijing Institute of Graphic Communication Beijing Institute of Graphic Communication, BIGC,Beijing,China

2. Beijing Institute of Petrochemical Technology Beijing Beijing Institute of Petrochemical Technology Beijing, BIPT,Department of Information Engineering,Beijing,China

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10021331/10021332/10021339.pdf?arnumber=10021339

Reference5 articles.

1. Defect Identification of Adhesive Structure Based on DCGAN and YOLOv5

2. Chip Contour Detection Based on Real-time Image Sensing and Recognition

3. YAPAY GÖRME TABANLI KUMAŞ HATA TESPİT SİSTEMİ

4. A Study of YOLO Algorithm for Target Detection

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