Mechanical stress caused frequency drift in cryogenic sapphire resonators
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Publisher
IEEE
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http://xplorestaging.ieee.org/ielx5/7585/20668/00956368.pdf?arnumber=956368
Cited by 10 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. A cryogenic sapphire resonator oscillator with 10−16 mid-term fractional frequency stability;Applied Physics Letters;2023-07-24
2. Tests of Sapphire Crystals Manufactured With Different Growth Processes for Ultra-Stable Microwave Oscillators;IEEE Transactions on Microwave Theory and Techniques;2016-01
3. High stability Cryocooled 10 GHz oscillator for the European Space Agency;2010 IEEE International Frequency Control Symposium;2010-06
4. ELISA: A cryocooled 10 GHz oscillator with 10−15 frequency stability;Review of Scientific Instruments;2010-02
5. Frequency stability and phase noise of a pair of X-band cryogenic sapphire oscillators;Measurement Science and Technology;2007-03-06
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