Studying the Effects of Prolonged Thermal Stress Aiming to Induce Artificial Aging on DRAM Retention-Based Physical Unclonable Functions-Reference-Cited by-同舟云学术

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Studying the Effects of Prolonged Thermal Stress Aiming to Induce Artificial Aging on DRAM Retention-Based Physical Unclonable Functions

Published:2024-01-06 Issue: Volume:9813 Page:1-6
ISSN:
Container-title:2024 IEEE International Conference on Consumer Electronics (ICCE)
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Author:

Anagnostopoulos Nikolaos Athanasios¹,Mexis Nico¹,Fan Yufan²,Bartsch Stephanie Senjuty³,Schaier Tanja¹,Katzenbeisser Stefan¹,Arul Tolga¹

Affiliation:

1. University of Passau,Faculty of Computer Science and Mathematics,Passau,Germany,94032

2. Technical University of Darmstadt,Department of Electrical Engineering and Information Technology,Darmstadt,Germany,64283

3. Technical University of Darmstadt,Department of Computer Science,Darmstadt,Germany,64289

Funder

Interreg

Deutsche Forschungsgemeinschaft

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10444098/10444131/10444494.pdf?arnumber=10444494

Reference19 articles.

1. Accelerated aging system for prognostics of power semiconductor devices

2. DRAM Retention Behavior with Accelerated Aging in Commercial Chips

3. A review of power cycle driven fatigue, aging, and failure modes for semiconductor power modules

4. A high-efficiency aging test with new data processing method for semiconductor device

5. BTI aging-based physical cloning attack on SRAM PUF and the countermeasure

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