Author:
Roy Soham,Millican Spencer K.,Agrawal Vishwani D.
Cited by
7 articles.
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1. A Survey and Recent Advances: Machine Intelligence in Electronic Testing;Journal of Electronic Testing;2024-04
2. HybMT: Hybrid Meta-Predictor based ML Algorithm for Fast Test Vector Generation;2024 29th Asia and South Pacific Design Automation Conference (ASP-DAC);2024-01-22
3. An Amalgamated Testability Measure Derived from Machine Intelligence;2024 37th International Conference on VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID);2024-01-06
4. A Review of Intelligent Design for Test Based on Machine Learning;2023 International Symposium of Electronics Design Automation (ISEDA);2023-05-08
5. Neural Fault Analysis for SAT-based ATPG;2022 IEEE International Test Conference (ITC);2022-09