Failure Mechanism Analysis of Bond Wire of High Power IGBT under Different Load Current
Author:
Affiliation:
1. Hunan University,College of Electrical and Information Engineering,Changsha,China
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9845798/9845816/09846435.pdf?arnumber=9846435
Reference17 articles.
1. Degradation evolution in high power IGBT modules subjected to sinusoidal current load
2. Thermo-mechanical stress of bonded wires used in high power modules with alternating and direct current modes
3. A review of failure mechanism of power devices based on physics-of-failure;xuemei;Trans China Electrotechnical Society,2019
4. Influence and Mechanism Analysis of Load Pulse Duration on Failure Mode of High Power IGBT Module Under Power Cycling Condition;jie;Proceedings of the CSEE,2020
Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. An Online Monitoring Method for Bond Wire Fatigue in IGBT Module;IEEE Journal of the Electron Devices Society;2024
2. Research on Online Monitoring Method for Bond Wire Fatigue Applied to IGBT Module;Electronics;2023-08-14
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