Characterization and design for variability and reliability-Reference-Cited by-同舟云学术

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Characterization and design for variability and reliability

Published:2008-09 Issue: Volume: Page:
ISSN:
Container-title:2008 IEEE Custom Integrated Circuits Conference
language:
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Author:

Nowka Kevin,Nassif Sani,Agarwal Kanak

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/4665385/4671999/04672092.pdf?arnumber=4672092

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Design of Efficient, Dependable SoCs Based on a Cross-Layer-Reliability Approach with Emphasis on Wireless Communication as Application and DRAM Memories;Dependable Embedded Systems;2020-12-10

2. A Cross-Layer Reliability Design Methodology for Efficient, Dependable Wireless Receivers;ACM Transactions on Embedded Computing Systems;2014-07

3. Cross-Layer Error Resilience and Its Application to Wireless Communication Systems;Journal of Low Power Electronics;2013-04-01

4. Architecture of source-drain cavity of a p-channel field effect transistor for embedding with epitaxial SiGe for enhanced performance;Journal of Applied Physics;2011-09-15

5. New placement prediction and mitigation techniques for local routing congestion;2010 IEEE/ACM International Conference on Computer-Aided Design (ICCAD);2010-11

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