Characterization of Dielectric Walls of Capacitors-Reference-Cited by-同舟云学术

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Characterization of Dielectric Walls of Capacitors

Published:2020-07-05 Issue: Volume: Page:
ISSN:
Container-title:2020 IEEE 3rd International Conference on Dielectrics (ICD)
language:
Short-container-title:

Author:

Gnonhoue O. G.¹,Velazquez-Salazar A.¹,Millard L.²,Joncas S.²,David E.¹,Cormier L.³,Poudret R.²,Preda I.⁴

Affiliation:

1. École de technologie supérieure,Department of Mechanical Engineering,Montreal,Canada

2. École de technologie supérieure,Department of Automated Manufacturing Engineering,Montreal,Canada

3. Université du Québec à Trois-Rivières (Drummondville campus),Department of Mechanical Engineering,Drummondville,Canada

4. University of Applied Sciences of Western Switzerland,Energy Institute – HEIA Fribourg,Switzerland

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9341294/9341806/09341843.pdf?arnumber=9341843

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Influence of Impregnation State on the Electrical Characteristics of Polypropylene Film for High-voltage capacitors;2023 10th International Forum on Electrical Engineering and Automation (IFEEA);2023-11-03

2. Dry-type High Voltage Capacitors;2022 IEEE 4th International Conference on Dielectrics (ICD);2022-07-03

3. Measurement and Analysis of partial discharges patterns in high voltage resin impregnated capacitors;2021 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP);2021-12-12

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