Semi-Supervised Automated Layer Identification of X-ray Tomography Imaged PCBs
Author:
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9337561/9337562/09337738.pdf?arnumber=9337738
Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. X-Factor: Deep Learning-based PCB Counterfeit Detection using X-Ray CT Techniques for Hardware Assurance;Proceedings of the 21st ACM International Conference on Computing Frontiers: Workshops and Special Sessions;2024-05-07
2. An active learning method based on result quality evaluation for printed circuit board computed tomography image segmentation;IET Image Processing;2023-08-09
3. Automated layer identification and segmentation of x‐ray computer tomography imaged PCBs;X-Ray Spectrometry;2023-06-25
4. A real-time defect detection in printed circuit boards applying deep learning;EUREKA: Physics and Engineering;2022-03-31
5. ChangeChip: A Reference-Based Unsupervised Change Detection for PCB Defect Detection;2021 IEEE Physical Assurance and Inspection of Electronics (PAINE);2021-11-30
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