Validation of Digital Twins: Challenges and Opportunities
Author:
Affiliation:
1. The MITRE Corporation,McLean,VA,USA,22102
2. Institute of Applied Informatics and Formal, Description Methods, Karlsruhe Institute of Technology,Karlsruhe,GERMANY,76133
3. DTU Compute, Technical University of Denmark,Kongens Lyngby,DENMARK,2800
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10015196/10015230/10015420.pdf?arnumber=10015420
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