Optical metrology of thin film solar cells from 0.2 to 30 µm-Reference-Cited by-同舟云学术

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Optical metrology of thin film solar cells from 0.2 to 30 µm

Published:2010-06 Issue: Volume: Page:
ISSN:
Container-title:2010 35th IEEE Photovoltaic Specialists Conference
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Author:

Attygalle Dinesh,Huang Zhiquan,Koirala Prakash,Aryal Puruswottam,Sestak Michelle N.,Dahal Lila R.,Mapes Meghan R.,Salupo Carl,Collins R. W.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/5604820/5614036/05616076.pdf?arnumber=5616076

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Optical simulation of external quantum efficiency spectra of CuIn1−Ga Se2 solar cells from spectroscopic ellipsometry inputs;Journal of Energy Chemistry;2018-07

2. Ex Situ Analysis of Multijunction Solar Cells Based on Hydrogenated Amorphous Silicon;Spectroscopic Ellipsometry for Photovoltaics;2018

3. Optical characterization of macro-, micro- and nanostructures using polarized light;Journal of Physics: Conference Series;2014-12-03

4. Optical characterization of laterally and vertically structured oxides and semiconductors;SPIE Proceedings;2014-03-08

5. Correlations Between Mapping Spectroscopic Ellipsometry Results and Solar Cell Performance for Evaluations of Nonuniformity in Thin-Film Silicon Photovoltaics;IEEE Journal of Photovoltaics;2013-01

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