Diagnosis of Power Transistors Open-and Short-Circuit Faults in SRM Drives through Current Error Analysis-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Diagnosis of Power Transistors Open-and Short-Circuit Faults in SRM Drives through Current Error Analysis

Published:2021-08-22 Issue: Volume: Page:
ISSN:
Container-title:2021 IEEE 13th International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives (SDEMPED)
language:
Short-container-title:

Author:

Ali Nasir,Gao Qiang,Ma Ke

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9605249/9605487/09605498.pdf?arnumber=9605498

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Fault-Tolerant SRM Drives—A Review;IEEE Transactions on Power Electronics;2024-08

2. Fault Diagnosis of Full-Bridge Power Converter for SRMs Based on Modified Current Detection;IEEE Journal of Emerging and Selected Topics in Power Electronics;2024-02

3. Open-circuit fault diagnosis of three-phase PWM rectifier circuits based on transient characteristics and random forest classification;Journal of Power Electronics;2023-10-17

4. Reviewing Fault Diagnosis Methods in Electric Drives: Power Subsystem and Electrical Machine;2023 IEEE 24th International Conference of Young Professionals in Electron Devices and Materials (EDM);2023-06-29

5. Detection and Discrimination of Multiple Faults in Switched Reluctance Motor Drives for Safety-Critical Applications;2022 IEEE International Conference on Industrial Technology (ICIT);2022-08-22

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP