Measurement of the Nonlinear Loss and Effective Free Carrier Lifetime in Silicon Microring Resonators-Reference-Cited by-同舟云学术

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Measurement of the Nonlinear Loss and Effective Free Carrier Lifetime in Silicon Microring Resonators

Published:2024-05-01 Issue:9 Volume:42 Page:3300-3305
ISSN:0733-8724
Container-title:Journal of Lightwave Technology
language:
Short-container-title:J. Lightwave Technol.

Author:

Mehta Karan¹^ORCID,Kumar Ranjeet¹^ORCID,Tanzid Mehbuba¹,Gold David¹^ORCID,Rong Haisheng¹^ORCID,Jones Richard¹^ORCID

Affiliation:

1. Intel Corporation, Santa Clara, CA, USA

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Link

http://xplorestaging.ieee.org/ielx7/50/10500897/10399474.pdf?arnumber=10399474

Reference27 articles.

1. A 128 Gb/s PAM4 Silicon Microring Modulator With Integrated Thermo-Optic Resonance Tuning

2. Narrow Spectral Linewidth Silicon Photonic Wavelength Tunable Laser Diode for Digital Coherent Communication System

3. Quantum dot SOA/silicon external cavity multi-wavelength laser

4. Widely tunable Vernier ring laser on hybrid silicon

5. Integrated Coherent Tunable Laser (ICTL) with ultra-wideband wavelength tuning and sub-100 Hz Lorentzian linewidth

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Characterization of Free Carrier Nonlinearities in Silicon-on-Insulator Microring Resonators;2024 24th International Conference on Transparent Optical Networks (ICTON);2024-07-14

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