JITLine: A Simpler, Better, Faster, Finer-grained Just-In-Time Defect Prediction
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Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9463061/9463063/09463103.pdf?arnumber=9463103
Cited by 54 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Fine-SE: Integrating Semantic Features and Expert Features for Software Effort Estimation;Proceedings of the 46th IEEE/ACM International Conference on Software Engineering;2024-02-06
2. Towards an understanding of intra-defect associations: Implications for defect prediction;Journal of Systems and Software;2024-01
3. JITGNN: A deep graph neural network framework for Just-In-Time bug prediction;Journal of Systems and Software;2024-01
4. Estimating Uncertainty in Labeled Changes by SZZ Tools on Just-In-Time Defect Prediction;ACM Transactions on Software Engineering and Methodology;2023-12-11
5. Code Revert Prediction with Graph Neural Networks: A Case Study at J.P. Morgan Chase;Proceedings of the 1st International Workshop on Software Defect Datasets;2023-12-08
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