Single-Event Effect Responses of CMOS Integrated Planar Multiturn Inductors in LC-Tank Oscillators Under Heavy-Ion Microbeam Irradiation
Author:
Affiliation:
1. ESAT-ADVISE Research Laboratory, KU Leuven, Leuven, Belgium
2. CERN, Geneva, Switzerland
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Link
http://xplorestaging.ieee.org/ielx8/23/10604658/10557643.pdf?arnumber=10557643
Reference21 articles.
1. The lpGBT PLL and CDR Architecture, Performance and SEE Robustness
2. A Comparative Study of Ring VCO and LC-VCO: Design, Performance Analysis, and Future Trends
3. Comparison of parameters of ring and LC-tank digitally controlled oscillators in 0.13 µm CMOS
4. Comparison of a 65 nm CMOS Ring- and LC-Oscillator Based PLL in Terms of TID and SEU Sensitivity
5. Single-Event Transient Effect on a Self-Biased Ring-Oscillator PLL and an LC PLL Fabricated in SOS Technology
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