TCAD-Enabled Machine Learning Defect Prediction to Accelerate Advanced Semiconductor Device Failure Analysis
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Publisher
IEEE
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http://xplorestaging.ieee.org/ielx7/8863874/8870352/08870440.pdf?arnumber=8870440
Cited by 21 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
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2. A machine learning approach for optimizing and accurate prediction of performance parameters for stacked nanosheet transistor;Physica Scripta;2024-03-04
3. Unveiling Thermal Cross Talk in 5nm Gate-All-Around Stacked Nanosheet FETs: A Machine Learning Perspective;2024 37th International Conference on VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID);2024-01-06
4. Automatic TCAD Model Parameter Calibration using Autoencoder;2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD);2023-09-27
5. Device Image-IV Mapping using Variational Autoencoder for Inverse Design and Forward Prediction;2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD);2023-09-27
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