Author:
Putra A.T.,Tsunomura T.,Nishida A.,Kamohara S.,Takeuchi K.,Hiramoto T.
Cited by
3 articles.
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1. Reliability Evaluation of Hot Carrier Injection Effects on MOSFET Devices;2023 5th International Conference on Inventive Research in Computing Applications (ICIRCA);2023-08-03
2. PBTI Study in Native High Voltage Device;2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA);2019-07
3. Offset voltage estimation model for latch-type sense amplifiers;IET Circuits, Devices & Systems;2010