Enhancing Critical Infrastructure and Key Resources (CIKR) Level-0 Physical Process Security Using Field Device Distinct Native Attribute Features-Reference-Cited by-同舟云学术

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Enhancing Critical Infrastructure and Key Resources (CIKR) Level-0 Physical Process Security Using Field Device Distinct Native Attribute Features

Published:2018-05 Issue:5 Volume:13 Page:1215-1229
ISSN:1556-6013
Container-title:IEEE Transactions on Information Forensics and Security
language:
Short-container-title:IEEE Trans.Inform.Forensic Secur.

Author:

Lopez Juan^ORCID,Liefer Nathan C.,Busho Colin R.,Temple Michael A.^ORCID

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Computer Networks and Communications,Safety, Risk, Reliability and Quality

Link

http://xplorestaging.ieee.org/ielx7/10206/8272400/08125733.pdf?arnumber=8125733

Cited by 12 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Detect Insider Attacks in Industrial Cyber-physical Systems Using Multi-physical Features-based Fingerprinting;ACM Transactions on Sensor Networks;2024-01-09

2. Ensuring the longevity of WirelessHART devices in industrial automation and control systems using distinct native attribute fingerprinting;International Journal of Critical Infrastructure Protection;2023-12

3. Ethernet Device Authentication via Physical Layer Fingerprinting;SoutheastCon 2023;2023-04-01

4. Active 2D-DNA Fingerprinting of WirelessHART Adapters to Ensure Operational Integrity in Industrial Systems;Sensors;2022-06-29

5. Real Time Threat Assessment of Truck Cargos Carrying Dangerous Goods for Preventing Terrorism Attacks on Neighboring Critical Infrastructures;IEEE Access;2022

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