Author:
Li Mengxuan,Bai Siqi,Makharashvili Tamar,Ruehli Albert E.,Drewniak James L.,Beetner Daryl
Funder
National Science Foundation
Cited by
2 articles.
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1. A Method for Deembedding the Mounting Pad and Via-Hole Effect in a Test Fixture for Accurate Impedance Measurement of the Surface Mount Device Component;IEEE Transactions on Instrumentation and Measurement;2024
2. Analysis of Capacitor non-idealities on PDN performance;2023 Joint Asia-Pacific International Symposium on Electromagnetic Compatibility and International Conference on ElectroMagnetic Interference & Compatibility (APEMC/INCEMIC);2023-05-23